This eighth volume in the series covering the latest results in the field includes abstracts of papers which appeared between the publication of Annual Retrospective VII (Volumes 230-232) and the end of 2005 (allowing for vagaries of journal availability).
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Part of the series covering the results in the field, this eighth volume includes abstracts of papers, which appeared between the publication of "Annual Retrospective VII" and the end of the year 2005. It provides an insight into trends in semiconductor theory, processing and applications as related to diffusional phenomena and defect behavior.
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The Size Distribution of Defect Clusters in n-Si (FZ, Cz), Irradiated by Fast NeutronsRole of Diffusion in the Shaping of the High-Absorption State in a Resonatorless Exciton Bistable SystemOn the Interaction of Dislocations with Impurities in SiliconOxygen Enrichment of Silicon Wafer by Ion Implantation Method and Fabrication of Surface Barrier DetectorsDFT Analysis of the Indium-Antimony-Vacancy Cluster in SiliconGrowth and Characterization of Boron-Doped Si1-x-yGexCy Layers Grown by Reduced Pressure Chemical Vapor DepositionIdentification of the Nature of Deep Trap States in Molecular Beam Epitaxially Grown Gallium Arsenide
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Produktdetaljer

ISBN
9783908451167
Publisert
2005-11-01
Utgiver
Vendor
Trans Tech Publications Ltd
Vekt
800 gr
Høyde
240 mm
Bredde
170 mm
Dybde
18 mm
Aldersnivå
U, UU, UP, P, 05, 06
Språk
Product language
Engelsk
Format
Product format
Heftet

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