VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Heftet /
2017
/ Engelsk
Produktdetaljer
ISBN
9789811074691
Publisert
2017-12-22
Utgiver
Vendor
Springer Verlag, Singapore
Høyde
235 mm
Bredde
155 mm
Aldersnivå
Research, P, UP, 06, 05
Språk
Product language
Engelsk
Format
Product format
Heftet
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Les mer
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.
Les mer
Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.
Les mer
Includes supplementary material: sn.pub/extras
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Les mer
Produktdetaljer
ISBN
9789811074691
Publisert
2017-12-22
Utgiver
Vendor
Springer Verlag, Singapore
Høyde
235 mm
Bredde
155 mm
Aldersnivå
Research, P, UP, 06, 05
Språk
Product language
Engelsk
Format
Product format
Heftet