This special issue contains essays regarding the CHI '95 conference, which featured a panel titled, Discount or Disservice? Discount Usability Analysis: Evaluation at a Bargain Price or Simply Damaged Merchandise? Wayne Gray, who organized the panel, presented a controversial critique of studies that had evaluated various usability evaluation methods (UEMs). The level of interest in this discussion led Gray to propose a review article that dealt with the issues in a more systematic fashion. The resulting essay, written by Gray and his collaborator Marilyn Salzman, conducted an in-depth review of a series of influential studies that used experimental methods to compare a variety of UEMs. Gray and Salzman's analysis was framed using Cook and Campbell's (1979) well-known discussion of various forms of validity. They used this to evaluate numerous details of these comparative studies, and they concluded that the studies fell short on the criteria by which good experimental studies are designed and interpreted.
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This special issue contains essays regarding the CHI '95 conference, which featured a panel titled, Discount or Disservice? Discount Usability Analysis: Evaluation at a Bargain Price or Simply Damaged Merchandise?
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Volume 13, Number 3, 1998Contents:G.M. Olson, T.P. Moran, Editorial. Introduction to This Special Issue on Experimental Comparisons of Usability Evaluation Methods. W.D. Gray, M.C. Salzman, Essay. Damaged Merchandise? A Review of Experiments That Compare Usability Methods. J. Karat, R. Jeffries, J.Miller, A.M. Lund, I. McClelland, B.E. John, A.F. Monk, S.L. Oviatt, J.M. Carroll, W.E. Mackay, W.M. Newman, G.M. Olson, T.P. Moran, Commentary and Reply. Commentary on "Damaged Merchandise?" W.D. Gray, M.C. Salzman, Repairing Damaged Merchandise: A Rejoinder.
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Produktdetaljer

ISBN
9780805898132
Publisert
1998-12-01
Utgiver
Vendor
CRC Press Inc
Vekt
204 gr
Høyde
229 mm
Bredde
152 mm
Aldersnivå
UU, UP, P, 05, 06
Språk
Product language
Engelsk
Format
Product format
Heftet
Antall sider
138

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University of Michigan. Xerox Palo Alto Research Center.