This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.
Les mer
This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.
Les mer
Evolution of Fault Tolerant Design.- Fault and Reliability Models.- Energy Efficient Design Techniques.- Error Correction Coding.- System-level Reliable Design.- Fault Tolerant.- Finite Field Arithmetic Circuit Design and Testing Techniques.- Reliable Network-on-Chip Architectures.- Energy Efficient Reconfigurable Systems.- Bio-Inspired Online Fault Detection in NoC Interconnect.- Fault-tolerant dynamically reconfigurable NoC-based SoC.
Les mer
This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented. · Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability;· Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches;· Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.
Les mer
Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches Includes discussion of emerging issues related to technology scaling, next generation memory and logic design Includes supplementary material: sn.pub/extras
Les mer
Produktdetaljer
ISBN
9781461441922
Publisert
2013-09-08
Utgiver
Vendor
Springer-Verlag New York Inc.
Høyde
235 mm
Bredde
155 mm
Aldersnivå
Research, P, 06
Språk
Product language
Engelsk
Format
Product format
Innbundet