This second volume in the new-format coverage of the latest results in the field covers abstracts from the approximate period of mid-1998 to mid-1999. As always, due to the vagaries of some journal publication dates, abstracts of earlier work may be included in order that the present contents merge seamlessly with those of volumes 162-163; the previous issue in this sub-series.
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An Annual Retrospective II
IR Studies of Oxygen-Yacancy Related Defects in Irradiated SiliconCalculation of Cd Diffusion Profiles in GaAsTheory of Enhanced/Retarded Diffusion of Donor/Acceptor Dopants in Predoped SiliconGa Self-Diffusion in GaAs
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Produktdetaljer

ISBN
9783908450467
Publisert
1999-06-17
Utgiver
Vendor
Trans Tech Publications Ltd
Vekt
730 gr
Høyde
240 mm
Bredde
170 mm
Dybde
17 mm
Aldersnivå
UP, P, 05, 06
Språk
Product language
Engelsk
Format
Product format
Heftet

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